Kim Kwan-Su | Department of Electronic Materials Engineering, Kwangwoon University, 447-1 Wolgye-dong, Nowon-gu, Seoul 139-701, Korea
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概要
- Kim Kwan-Suの詳細を見る
- 同名の論文著者
- Department of Electronic Materials Engineering, Kwangwoon University, 447-1 Wolgye-dong, Nowon-gu, Seoul 139-701, Koreaの論文著者
関連著者
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Cho Won-ju
Department Of Electronic Material Engineering Kwangwoon University
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Kim Kwan-Su
Department of Electronic Materials Engineering, Kwangwoon University, 447-1 Wolgye-dong, Nowon-gu, Seoul 139-701, Korea
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Lee In-kyu
Department Of Endocrinology And Metabolism Kyungpook National University Hospital
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Jung Jongwan
Department Of Nano Science And Technology Sejong University
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Lee Se-won
Department Of Dermatology And Institute Of Hair And Cosmetic Medicine Yonsei University Wonju Colleg
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Gu Ja-gyeong
Department Of Food Science And Biotechnology Of Animal Resources Konkuk University
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Jung Myung-Ho
Department of Electronic Materials Engineering, Kwangwoon University, 447-1 Wolgye-dong, Nowon-gu, Seoul 139-701, Korea
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Jung Jongwan
Department of nano-science and technology, Sejong University, 98 Gunja-dong, Gwangjin-gu, Seoul 143-747, Korea
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Park Goon-Ho
Department of Electronic Materials Engineering, Kwangwoon University, 447-1 Wolgye-dong, Nowon-gu, Seoul 139-701, Korea
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Kim Kwan-Su
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Lee In-Kyu
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
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Gu Ja-gyeong
Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
著作論文
- Charge Trapping Characteristics of Variable Oxide Thickness Tunnel Barrier with SiO2/HfO2 or Al2O3/HfO2 Stacks for Nonvolatile Memories
- Comparative Study of Device Performance and Reliability in Amorphous InGaZnO Thin-Film Transistors with Various High-k Gate Dielectrics