FUKUSHIMA Takehiro | Department of Communication Engineering, Okayama Prefectural University
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- FUKUSHIMA Takehiroの詳細を見る
- 同名の論文著者
- Department of Communication Engineering, Okayama Prefectural Universityの論文著者
Department of Communication Engineering, Okayama Prefectural University | 論文
- Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide
- A CMOS Temperature Sensor Circuit(Integrated Electronics)
- A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width(Semiconductor Materials and Devices)
- A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET(Semiconductor Materials and Devices)
- Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide