Yoo Hyung | Semiconductor Division, Electronics and Telecommunications Research Institute
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- YOO Hyung Jounの詳細を見る
- 同名の論文著者
- Semiconductor Division, Electronics and Telecommunications Research Instituteの論文著者
Semiconductor Division, Electronics and Telecommunications Research Institute | 論文
- Electrical and Microstructural Analyses on the Au/Ni/Au/Ge/Pd Ohmic Contact to n-InGaAs and n-GaAs
- Electrical and Microstructural Analyses on Pd/Ge-Based Ohmic Contact to n-InGaAs
- DEGRADATION MECHANISM OF ELECTRON EMISSION CHARACTERISTICS IN SILICON FIELD EMITTERS
- APPLICATIONS OF CHEMICAL-MECHANICAL-POLISHING PROCESS TO SILICON FIELD EMITTER ARRAY
- POLYCRYSTALLINE SILICON FIELD EMITTER ARRAYS WITH A GATED STRUCTURE