Lin Kun-Cheng | Institute of Materials Science and Engineering, National Chiao Tung University
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概要
Institute of Materials Science and Engineering, National Chiao Tung University | 論文
- Investigation of Carrying Agents on Microstructure of Electroplated Cu Films
- Characteristics of Nonalloyed Pseudomorphic High Electron Mobility Transistors Using InAs/In_xGa_As(x=1→0)/Al_yGa_(y=0→0.3)Contact Structures
- Effectively Blocking Copper Diffusion at Low-k Hydrogen Silsesquioxane/Copper Interface
- Substrate Bias Effect on Amorphous Hydrogenated Carbon Films Deposited by Filtered Cathodic Arc Deposition : Surfaces, Interfaces, and Films
- Effect of Post-treatment on Electrical Properties of Amorphous Hydrogenated Carbon Films Deposited by Gridless Ion Beam Deposition