Altaf-Ul-Amin Md. | Graduate School of Information Science, Nara Institute of Science and Technology (NAIST)

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Graduate School of Information Science, Nara Institute of Science and Technology (NAIST) | 論文

• F-Scan: A DFT Method for Functional Scan at RTL
• F-Scan : A DFT Method for Functional Scan at RTL
• Analyzing Path Delay Fault Testability of RTL Data Paths:A Non-Scan Approach (デザインガイヤ2000) -- (VLSIの設計/検証/テスト及び一般)
• Reduction in Over-Testing of Delay Faults through False Paths Identification Using RTL Information
• Design for Two-Pattern Testability of Controller-Data Path Circuits

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