FURUKAWA Yoshitaka | The Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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- 同名の論文著者
- The Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporationの論文著者
The Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation | 論文
- Low-Temperature Behavior of the Threshold Current and Carrier Lifetime of InGaAsP-InP DH Lasers
- Degradation of InGaAsP-InP DH Lasers by In Solder
- Improved Sensitivity of Junction Capacitance Method Suitable for the Trap Evaluation in Stripe Geometry DH Lasers
- Effect of the Thermal Damage Introduced to GaAs Substrate during the GaAs, (AlGa)As LPE Process
- Epitaxial Growth of (AIGa)As and GaAs on (AlGa)As Substrate