Lee Byoung | Gwangju Institute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju 500-712, Korea

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概要

• Lee Byoung Hunの詳細を見る
• 同名の論文著者
• Gwangju Institute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju 500-712, Koreaの論文著者

関連著者

• Kim Tea

  Inha University, 253 Yonghyun-dong, Nam-gu, Incheon 402-751, Korea

• Choi Rino

  Inha University, 253 Yonghyun-dong, Nam-gu, Incheon 402-751, Korea

• Lee Byoung

  Gwangju Institute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju 500-712, Korea

• Park Hokyung

  SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.

著作論文

• Dominant Device Instability Mechanism in Scaled Metal–Oxide–Semiconductor Field-Effect Transistors with Hafnium Oxide Dielectric

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