Shui-Jinn Wang | Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1, University Rd., Tainan, Taiwan 701, R.O.C.

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Shui-Jinn Wang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1, University Rd., Tainan, Taiwan 701, R.O.C.
Der-Ming Kuo
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, Republic of China
Tron-Min Chen
Department of Electrical Engineering, Wu Feng Institute of Technology, Chia-yi Country 621, Taiwan, Republic of China
Pei-Ren Wang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, Republic of China
Kai-Ming Uang
Department of Electrical Engineering, Wu Feng Institute of Technology, Chia-yi Country 621, Taiwan, Republic of China
Shui-Jinn Wang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, Republic of China
Su Nai-chao
Institute Of Microelectronics Dept. Of Electrical Eng. National Cheng Kung Univ.
CHEN Tron-Min
Department of Electrical Engineering, Wu-Feng Institute of Technology
Wang Shui-jinn
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
Albert Chin
Department of Electronics Engineering, National Chiao-Tung University, Hsinchu 300, Taiwan
Chien-Hung Wu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1, University Rd., Tainan, Taiwan 701, R.O.C.
Chen-Kuo Chiang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1, University Rd., Tainan, Taiwan 701, R.O.C.
Uang Kai-Ming
Department of Electrical Engineering, WuFeng Institute of Technology, Chia-yi Country 621, Taiwan, Republic of China
Wei-Chi Lee
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, Republic of China
LEE Wei-Chi
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
Hao-Yuan Huang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1, University Rd., Tainan, Taiwan 701, R.O.C.
Yu-Han Chen
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1, University Rd., Tainan, Taiwan 701, R.O.C.
Huang Chin-Chuan
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1, University Rd., Tainan, Taiwan 701, R.O.C.
Po-Hong Wang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, Republic of China
Albert Chin
Department of Electronics Engineering, National Chiao-Tung University, University System of Taiwan, No. 1001, University Rd., Hsinchu, Taiwan 300, R.O.C.
Chin-Chuan Huang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1, University Rd., Tainan, Taiwan 701, R.O.C.
Hon-Yi Kuo
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, Republic of China
Po-Hung Wang
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, Republic of China
Kai-Ming Uang
Department of Electrical Engineering, Wu Feng Institute of Technology, Chia-yi, Taiwan, Republic of China
Tron-Min Chen
Department of Electrical Engineering, Wu Feng Institute of Technology, Chia-yi, Taiwan, Republic of China

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