Bauer Anton | Fraunhofer IISB, 91058 Erlangen, Germany
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概要
関連著者
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Bauer Anton
Fraunhofer IISB, 91058 Erlangen, Germany
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Suda Jun
Department Of Electrical Engineering Kushiro National College Of Technology
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Kimoto Tsunenobu
Department Of Electrical Engineering Faculty Of Engineering Kyoto University
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Noborio Masato
Department Of Electronic Science And Engineering Kyoto University
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Grieb Michael
Fraunhofer IISB, 91058 Erlangen, Germany
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Peters Dethard
SiCED Electronics Development GmbH & Co. KG, 91058 Erlangen, Germany
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Friedrichs Peter
SiCED Electronics Development GmbH & Co. KG, 91058 Erlangen, Germany
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DasGupta Nandita
Department of Electrical Engineering, IIT Madras, Chennai 600036, Tamil Nadu, India
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Selvi K.
Department of Electrical Engineering, IIT Madras, Chennai 600036, Tamil Nadu, India
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Sreenidhi Turuvekere
Department of Electrical Engineering, IIT Madras, Chennai 600036, Tamil Nadu, India
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Ryssel Heiner
Universitaet Erlangen, Lehrstuhl fuer Elektronische Bauelemente, Cauerstrasse 6, 91058 Erlangen, Germany
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Kimoto Tsunenobu
Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan
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Peters Dethard
SiCED Electronics Development GmbH & Co. KG, 91058 Erlangen, Germany
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Friedrichs Peter
SiCED Electronics Development GmbH & Co. KG, 91058 Erlangen, Germany
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Bauer Anton
Fraunhofer IISB, Schottkystrasse 10, 91058 Erlangen, Germany
著作論文
- Reliability of Nitrided Gate Oxides for N- and P-Type 4H-SiC(0001) Metal--Oxide--Semiconductor Devices
- High Pressure Oxidation of 4H-SiC in Nitric Acid Vapor