Ma Yutao | Institute Of Microelectronics Tsinghua University
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概要
Institute Of Microelectronics Tsinghua University | 論文
- Lateral Redistribution and Interactive Impacts of Localized Trapped Charges during Retention Baking in SONOS Memory
- Characteristics of Band-to-Band Hot Hole Injection for Erasing Operation in Charge Trapping Memory
- Distribution and Impact of Local Trapped Charges in Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) Memory
- Distribution and Impact of Local Trapped Charges in SONOS Memory
- Low-Voltage and Low-Current Flash Memory Using Source Induced Band-to-Band Tunneling Hot Electron Injection to Perform Programming