Okumura Y. | Ulsi Laboratory Mitsubishi Electric Corporation

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概要

• OKUMURA Y.の詳細を見る
• 同名の論文著者
• Ulsi Laboratory Mitsubishi Electric Corporationの論文著者

関連著者

• Inuishi M.

  Process Technology Development Div. Renesas Technology Corp.

• Inuishi M.

  Ulsi Development Center Mitsubishi Electric Corporation

• Inuishi M.

  Renesas Technology Corp. Wafer Process Engineering Development Dept.

• HIRAO T.

  ULSI Laboratory, Mitsubishi Electric Corporation

• Kuroi T.

  Process Technology Development Div. Renesas Technology Corp.

• OKUMURA Y.

  ULSI Laboratory, Mitsubishi Electric Corporation

• Kuroi T.

  Ulsi Laboratory Mitsubishi Electric Corporation

• Kuroi T.

  Process Technology Development Div Renesas Technology Corp.

• Hirao T.

  Ulsi Laboratory Mitsubishi Electric Corporation

• Okumura Y.

  Ulsi Laboratory Mitsubishi Electric Corporation

• SHIMIZU S.

  ULSI Laboratory, Mitsubishi Electric Corporation

• KUROI T.

  ULSI Laboratory, Mitsubishi Electric Corporation

• TERAMOTO A.

  ULSI Development Center, Mitsubishi Electric Corporation

• SHIRAHATA S.

  ULSI Laboratory, Mitsubishi Electric Corporation

• ANMA M.

  ULSI Laboratory, Mitsubishi Electric Corporation

• SHIRAHATA M.

  ULSI Laboratory, Mitsubishi Electric Corporation

• ABE Y.

  Semiconductor Research Laboratory, Mitsubishi Electric Corporation

• KUSUNOKI S.

  ULSI Laboratory, Mitsubishi Electric Corporation

• Kusunoki S.

  Ulsi Laboratory Mitsubishi Electric Corporation

• Shirahata M.

  Ulsi Laboratory Mitsubishi Electric Corporation

• Shirahata S.

  Ulsi Laboratory Mitsubishi Electric Corporation

• Teramoto A.

  Ulsi Development Center Mitsubishi Electric Corporation

• Anma M.

  Ulsi Laboratory Mitsubishi Electric Corporation

もっと見る 閉じる

著作論文

• Clarification of Nitridation Effect on Oxidation Methods
• Reliability of Non-Uniformly Doped Channel (NUDC) MOSFETs for Sub-Quarter-Micron Region
• Impact of Nitrogen Implantation on Highly Reliable Sub-Quarter Micron LDD MOSFETs

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