MISHIMA Y. | FUJITSU LABOTARORIES LIMITED

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概要

• MISHIMA Y.の詳細を見る
• 同名の論文著者
• FUJITSU LABOTARORIES LIMITEDの論文著者

関連著者

• Kihara F.

  Fujitsu Limited

• KUDO H.

  FUJITSU LABOTARORIES LIMITED

• MISHIMA Y.

  FUJITSU LABOTARORIES LIMITED

• SATOU S.

  FUJITSU LABOTARORIES LIMITED

• Okamato M.

  Fujitsu Limited

• ITO T.

  Process and Manufacturing Engineering Center, Semiconductor Company, Toshiba Corp.

• Sugimachi T.

  Fujitsu Limited

• ISHIKAWA K.

  FUJITSU LABOTARORIES LIMITED

• TANABE R.

  FUJITSU LABOTARORIES LIMITED

• FUKUTOME H.

  FUJITSU LABOTARORIES LIMITED

• SUGII T.

  FUJITSU LABOTARORIES LIMITED

• OKAMOTO M.

  FUJITSU LIMITED

• YOSHIMURA M.

  FUJITSU LIMITED

• HASHIMOTO H.

  FUJITSU LIMITED

• OHTSUKI M.

  FUJITSU LIMITED

• KUDO H.

  Advanced CMOS Technology Lab., Fujitsu Labs Ltd.

• ISHIKAWA K.

  Advanced CMOS Technology Lab., Fujitsu Labs Ltd.

• MISHIMA Y.

  Advanced CMOS Technology Lab., Fujitsu Labs Ltd.

• SATOU S.

  Advanced CMOS Technology Lab., Fujitsu Labs Ltd.

• KIHARA F.

  MCU Technology, Dept., Fujitsu Ltd.

• OKAMATO M.

  MCU Technology, Dept., Fujitsu Ltd.

• SUZUKI Y.

  Process Integration Dept., Fujitsu Ltd.

• NOMURA T.

  Process Integration Dept., Fujitsu Ltd.

• KAWANO M.

  Process Integration Dept., Fujitsu Ltd.

• NISHIKAWA K.

  Process Engineering Dept., Fujitsu Ltd.

• OZAKI Y.

  Product Engineering Dept., Fujitsu Ltd.

• Sugii T.

  Fujitsu Laboratories Ltd.

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著作論文

• Large Reduction in Standby Power Consumption Achieved with Stress-controlled SRAM Cell Layout
• Efficient Reduction of Standby Leakage Current in LSIs for Use in Mobile Devices

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