Ohmi T. | Department Of Electronic Eng. Graduate School Of Eng. Tohoku University
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概要
関連著者
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Ohmi T.
Department Of Electronic Eng. Graduate School Of Eng. Tohoku University
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Adan A.
Ic Development Group Sharp Corp.
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KUBO K.
Department of Dental Anesthesiology, Oral Health Science Center, Laboratory of Brain Research, Tokyo
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Ohmi T.
Department Of Electronics Faculty Of Engineering Tohoku University
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Ohmi K.
Department Of Electronics Faculty Of Engineering Tohoku University
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IWAMOTO T.
Department of Electronics, Faculty of Engineering, Tohoku University
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YABUNE T.
Department of Electronics, Faculty of Engineering, Tohoku University
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MIYAKE T.
Department of Electronics, Faculty of Engineering, Tohoku University
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IZUMI H.
Department of Electronics, Faculty of Engineering, Tohoku University
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NOSE M.
Department of Electronics, Faculty of Engineering, Tohoku University
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OJIMA S.
Department of Electronics, Faculty of Engineering, Tohoku University
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HIGASHI K.
IC Development Group, SHARP Corp.
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MORIMOTO H.
IC Development Group, SHARP Corp.
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NIIMI K.
IC Development Group, SHARP Corp.
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ASHIDA T.
IC Development Group, SHARP Corp.
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SUGAWA S.
Department of Electronic Eng., Graduate School of Eng., Tohoku University
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Ohmi T.
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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KUMAMI H.
Department of Electronic Engineering, Graduate School of Engineering, Tohoku University
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SHINDO W.
Department of Electronic Engineering, Graduate School of Engineering, Tohoku University
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INO K.
Department of Electronic Engineering, Graduate School of Engineering, Tohoku University
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Yabune T.
Department Of Electronics Faculty Of Engineering Tohoku University
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Kumami H.
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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Sugawa S.
Department Of Electronic Eng. Graduate School Of Eng. Tohoku University
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Ashida T.
Ic Development Group Sharp Corp.
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Niimi K.
Ic Development Group Sharp Corp.
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Ojima S.
Department Of Electronics Faculty Of Engineering Tohoku University
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Ino K.
Department Of Electronic Engineering Graduate School Of Engineering Tohoku University
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Kubo K.
Departamento De Entomologia Fitopatologia E Zoologia Agricola Escola Superior De Agricultura "l
著作論文
- Formation Process of Highly Reliable Ultra-Thin Gate Oxide
- The Cleaning of Particle and Metallic Impurity on Si Wafer Surface by Fluorine Etchant
- Ultra-Low Standby Current in SOI-CMOS LSI Circuits by Using Body-Bias-Control Technology
- Enhancement of Silicon Epitaxy by Increased Phosphorus Concentration in a Low Energy Ion Bombardment Process