So Y | School Of Physics And Research Center For Oxide Electronics Seoul National University
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概要
School Of Physics And Research Center For Oxide Electronics Seoul National University | 論文
- Dynamical Aspects of Retention and its Relation to Fatigue in Ferroelectric Thin Films
- High Resistance Against Hydrogen-Induced Degradation in Ferroelectric Bi_La_Ti_3O_Thin Films
- Hydrogen-Induced Degradation Mechanisms in Ferroelectric PbZr_Ti_O_3 and Bi_La_Ti_3O_ Thin Films
- Extraction method of the interface and nitride trap density in nitride-based charge trapped flash memories using an optical response (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Extraction method of the interface and nitride trap density in nitride-based charge trapped flash memories using an optical response (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))