Noguchi Takashi | Central Research Laboratory Mitsubishi Electric Corporation
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概要
関連著者
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Noguchi Takashi
Central Research Laboratory Mitsubishi Electric Corporation
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NOGUCHI Takashi
Central Research Laboratory, Mitsubishi Electric Corporation
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林 康明
京都工芸繊維大学大学院
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林康 明
京都工芸繊維大学工芸学部電子情報工学科
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林 康明
京都工芸繊維大学大学院工芸科学研究科
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Hayashi Yuzo
Irie Koken Co. Ltd.
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Sakai Kiyomi
Department Of Applied Physics Faculty Of Engineering Osaka University
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Kobayashi Masayoshi
Departmdepartment Of Cardiology Nagoya University Graduate School Of Medicine
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Hayashi Yoshikazu
Department Of Internal Medicine Hokkaido Prefectural Haboro Hospital
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Kobayashi Masayoshi
Department Of Applied Physics Faculty Of Engineering Osaka University
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HAYASHI Yoshikazu
Department of Internal Medicine, Hokkaido Prefectural Haboro Hospital
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Kobayashi Masayoshi
Department of Vascular Surgery, Nagoya University Graduate School of Medicine
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HAMANAKA Koichi
Central Research Laboratory, Mitsubishi Electric Corporation
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Kobayashi M
Mitsubishi Electric Corp. Hyogo Jpn
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SAKAI Kiyomi
Department of Applied Physics, Osaka University
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FUJITA Shigeru
Department of Internal Medicine 1, Ehime University School of Medicine
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Fujita Shigeru
Department Of Applied Physics Faculty Of Engineering Osaka University
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SOYAMA Nobuyuki
Central Research Institute, Mitsubishi Materials Corporation
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Ohkawa Norio
Central Research Laboratory Mitsubishi Electric Corporation
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HAMANAKA Kenjiro
Tsukuba Research Laboratory, Nippon Sheet Glass Co., Ltd.
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Hamanaka Koichi
Central Research Laboratory Mitsubishi Electric Corporation
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Fuji Jun
Central Research Institute, Mitsubishi Materials Corporation, Naka, Ibaraki 311-0102, Japan
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Doi Toshihiro
Central Research Institute, Mitsubishi Materials Corporation, Naka, Ibaraki 311-0102, Japan
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Sakurai Hideaki
Central Research Institute, Mitsubishi Materials Corporation, Naka, Ibaraki 311-0102, Japan
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Soyama Nobuyuki
Central Research Institute, Mitsubishi Materials Corporation, Naka, Ibaraki 311-0102, Japan
著作論文
- Shapiro Steps in Small-Area SIS Junction at 70 GHz and 140 GHz
- Planar DC SQUID with a Damping Resistor
- Pair and Quasiparticle Tunnelings in Arrays of SIS Junctions Observed by Radio Frequency Noise
- The Orientation and Grain Texture Effect on Life Time Reliability of Sol--Gel Derived PbZr0.52Ti0.48O3 Films