Wada Yoshinori | Musashino Electrical Communication Laboratory Ntt
スポンサーリンク
概要
関連著者
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Wada Yoshinori
Musashino Electrical Communication Laboratory Ntt
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CHINO Ken-ichi
Musashino Electrical Communication Laboatory
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Chino Ken'ichi
Musashino Electrical Communication Laboratory Ntt
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FUKUDA Kaneharu
Musashino Electrical Communication Laboratory, NTT
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Fukuda Kaneharu
Musashino Electrical Communication Laboratory Ntt
著作論文
- Analysis of Degradation Behavior of a Gunn Diode Based on the Dislocation Acceptor Theory
- A Degradation Mechanism for Ohmic Contacts in GaAs Devices
- Study on Reliability Factors of GaAs Devices with Plated Heat Sink