Study on Reliability Factors of GaAs Devices with Plated Heat Sink

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1974-10-05

著者

• CHINO Ken-ichi

  Musashino Electrical Communication Laboatory

• Wada Yoshinori

  Musashino Electrical Communication Laboratory Ntt

関連論文

• Deep-Level Transient Spectroscopy of Plastically-Bent Epitaxial GaAs
• Analysis of Degradation Behavior of a Gunn Diode Based on the Dislocation Acceptor Theory
• Behavior of the Schottky-Barrier Diode under Uniaxial Stress
• A Degradation Mechanism for Ohmic Contacts in GaAs Devices
• Study on Reliability Factors of GaAs Devices with Plated Heat Sink

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