Matsumoto Yoshishige | Fundamental Research Laboratories Nec Corporation:microelectronics Research Laboratories Nec Corpora
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Fundamental Research Laboratories Nec Corporation:microelectronics Research Laboratories Nec Corpora | 論文
- Structure Control of GaN Films Grown on (001) GaAs Substrates by GaAs Surface Pretreatments
- Control of the Electrical Properties of AlN/thin-a-Si/GaAs MIS Diodes by GaAs Surface Pretreatments
- Effects of InP Surface Treatment on the Electrical Properties and Structures of AlN/n-InP Interface
- Interfacial Superstructure of AIN/n-GaAs(001) System Fabricated by Metalorganic Chemical Vapor Deposition : Surfaces, Interfaces and Films
- Improvement of the Electrical Properties of the AlN/GaAs MIS System and Their Thermal Stability by GaAs Surface Stoichiometry Control : Surfaces, Interfaces and Films