Ren Tianling | Institute Of Microelectronics Tsinghua University
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概要
関連著者
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Ren Tianling
Institute Of Microelectronics Tsinghua University
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Zhu Jing
Electron Microscopy Laboratory School Of Materials Science And Engineering Tsinghua University
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Liu Litian
Institute Of Microelectronics Tsinghua University
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Li Zhijian
Institute Of Microelectronics Tsinghua University
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Zhu J
Electron Microscopy Laboratory School Of Materials Science And Engineering Tsinghua University
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ZHANG Qi
Electron Microscopy Laboratory, School of Materials Science and Engineering, Tsinghua University
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REN Tianling
Institute of Microelectronics, Tsinghua University
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ZHANG Lintao
Institute of Microelectronics, Tsinghua University
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Zhang Lintao
Institute Of Microelectronics Tsinghua University
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Zhang Qi
Electron Microscopy Laboratory School Of Materials Science And Engineering Tsinghua University
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Xie Dan
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Xie Dan
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
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Zhang Xhigang
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
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Zhang Zhigang
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
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Liu Litian
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
著作論文
- Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi2Ta2O9 Capacitors
- Interface and Surface Characterization of Lead Zirconate Titanate Thin Films Grown by Sol-Gel Method : Surfaces, Interfaces, and Films