Xie Dan | Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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概要
- Xie Danの詳細を見る
- 同名の論文著者
- Institute of Microelectronics, Tsinghua University, Beijing 100084, Chinaの論文著者
関連著者
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Xie Dan
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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LIU Li-Tian
Institute of Microelectronics, Tsinghua University
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Ren Tian-ling
Institute Of Microelectronics Tsingian University
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Liu Litian
Institute Of Microelectronics Tsinghua University
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Ren Tianling
Institute Of Microelectronics Tsinghua University
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Ren Tian-Ling
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Liu Li-Tian
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Xie Dan
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
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Xue Kan-Hao
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Liu Tian-Zhi
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Jia Ze
Institute of Microelectronics, Tsinghua University, Beijing 100084, China
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Zhang Xhigang
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
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Zhang Zhigang
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
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Liu Litian
Institute of Microelectronics, Tsinghua University, Beijing 100084, P. R. China
著作論文
- Investigation on Annealing and Etching Effects for Pt/Bi3.15Nd0.85Ti3O12/Pt Ferroelectric Capacitors
- Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi2Ta2O9 Capacitors