Okabayashi H | Nec Corp. Ibaraki Jpn

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概要

• 同名の論文著者
• Nec Corp. Ibaraki Jpnの論文著者

関連著者

• OKABAYASHI Hidekazu

  Microelectronics Research Laboratories, NEC Corporation

• Okabayashi H

  Nec Corp. Ibaraki Jpn

• Okabayashi Hidekazu

  Microelectronics Research Laboratories Nec Corporation

• HIGUCHI Koichi

  Department of Applied Chemistry, Faculty of Engineering, Gunma University

• Higuchi K

  Department Of Applied Chemistry Faculty Of Engineering Gunma University

• Higuchi Kohei

  Microelectronics Research Labs

• KANAMORI Masaru

  Fundamental Research Laboratories, Nippon Electric Co., Ltd.

• Kanamori M

  First Research Dept. Research & Development Div. Nok Corporation

• Kanamori Masaru

  Fundamental Research Laboratories Nec Corporation

• Morimoto M

  Division Of Physics Graduate School Of Science Hokkaido University

• Morimoto Mayumi

  北海道大学 大学院

• MOGAMI Tohru

  Microelectronics Research Laboratories, NEC Corporation

• Mogami Tohru

  Microelectronics Research Laboratories Nec Corporation

• MORIMOTO Mitsutaka

  Microelectronics Research Laboratories, NEC Corporation

• Morimoto Mitsutaka

  Microelectronics Research Laboratories Nippon Electric Co. Ltd.

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著作論文

• Planarized Via-Hole Filling with Molybdenum by Bias Sputtering : Techniques, Instrumentations and Measurement
• Mechanisms of Mo or Mo-Silicide/n^+ -Si Ohmic Contact Degradation Induced by High-Temperature Annealing
• Degradation Mechanisms on Mo or Mo-silicide/n^+ -Si Ohmic Contacts on High Temperature Annealing : LATE NEWS

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