Ugai Yasuhiro | Hosiden And Philips Display Corp.
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概要
関連著者
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Ugai Yasuhiro
Hosiden And Philips Display Corp.
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YUKAWA Teizo
Hosiden and Philips Display Corporation
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YUKAWA Teizo
Hosiden and Philips Display Corp.
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Chiang Chun-sung
The University Of Michigan Department Of Electrical Engineering And Computer Science Solid State Ele
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Kanicki Jerzy
The University Of Michigan Department Of Electrical Engineering And Computer Science Solid State Ele
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UGAI Yasuhiro
Hosiden and Philips Display Corporation
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AOKI Shigeo
Hosiden and Philips Display Corporation
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Takeuchi Seiji
Hitachi Research Laboratory Of Hitachi Lid.
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Kanicki Jerzy
Center for Display Technology and Manufacturing, Department of Electrical Engineering and Computer S
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Aoki S
Univ. Tsukuba Ibaraki
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Kanicki Jerzy
Center For Display Technology And Manufacturing Department Of Electrical Engineering And Computer Sc
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Takeuchi Susumu
Lsi R&d Laboratory Mitsubisi Electric Corporation
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AMANO Kazuaki
Hosiden and Philips Display Corporation
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HATTA Yoshihisa
Hosiden Corporation Research & Development Center
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Ugai Y
Hosiden And Philips Display Corp.
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Chiang Chun-sung
Center For Display Technology And Manufacturing Department Of Electrical Engineering And Computer Sc
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MARTIN Sandrine
Center for Display Technology and Manufacturing, Department of Electrical Engineering and Computer S
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TAKEUCHI Shu
Hosiden and Philips Display Corp.
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Aoki Shigeo
Hosiden Corporation Research & Development Center
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Yukawa T
Hosiden And Philips Display Corp.
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Yukawa Teizo
Hosiden Corporation Research & Development Center
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Ugai Yasuhiro
Hosiden Corporation Research & Development Center
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Hatta Yoshihisa
Hosiden Corporation Research & Development Center
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Martin S
Center For Display Technology And Manufacturing Department Of Electrical Engineering And Computer Sc
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Chiang Chun-Sung
The University of Michigan, Department of Electrical Engineering and Computer Science, Solid State Electronics Laboratory, Ann Arbor, MI 48109, USA
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Martin Sandrine
The University of Michigan, Department of Electrical Engineering and Computer Science, Solid State Electronics Laboratory, Ann Arbor, MI 48109, USA
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Nahm Jeong-Yeop
The University of Michigan, Department of Electrical Engineering and Computer Science, Solid State Electronics Laboratory, Ann Arbor, MI 48109, USA
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Li Tong
The University of Michigan, Department of Electrical Engineering and Computer Science, Solid State Electronics Laboratory, Ann Arbor, MI 48109, USA
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Ugai Yasuhiro
Hosiden and Philips Display Corp. 3-1, Takatsukadai, 4-chome, Nishi-ku, Kobe 651-22, Japan
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Ugai Yasuhiro
Hosiden and Philips Display Corporation, 4-3-1 Takatsukadai Nishi-ku, Kobe, Hyogo 651-2271 Japan
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Aoki Shigeo
Hosiden and Philips Display Corporation, 4-3-1 Takatsukadai Nishi-ku, Kobe, Hyogo 651-2271 Japan
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Yukawa Teizo
Hosiden and Philips Display Corporation, 4-3-1 Takatsukadai Nishi-ku, Kobe, Hyogo 651-2271 Japan
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Kanicki Jerzy
The University of Michigan, Department of Electrical Engineering and Computer Science, Solid State Electronics Laboratory, Ann Arbor, MI 48109, USA
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Amano Kazuaki
Hosiden and Philips Display Corporation, 4-3-1 Takatsukadai Nishi-ku, Kobe, Hyogo 651-2271 Japan
著作論文
- Top-Gate Staggered Amorphous Silicon Thin-Film Transistors: Series Resistance and Nitride Thickness Effects
- Reduced Process Method for Thin-Film-Transistor Liquid-Crystal Display (TFT-LCD) with Dry-Etching Tapered ITO Data Bus Lines
- Influence of the Amorphous Silicon Thickness on Top Gate Thin-Film Transistor Electrical Performances
- A Simple Ohmic-Contact Formation Technology using Phosphine Plasma Treatment for Top-Gate Amorphous-Silicon Thin-Film Transistors