Bolotov Leonid | Mirai Project Advanced Semiconductor Research Center National Institute Of Advanced Industrial Scien
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- Mirai Project Advanced Semiconductor Research Center National Institute Of Advanced Industrial Scienの論文著者
Mirai Project Advanced Semiconductor Research Center National Institute Of Advanced Industrial Scien | 論文
- Dopant-atom distribution measurement at p-n junctions on wet-prepared Si(111):H surfaces by scanning tunneling microscopy
- Scanning Tunneling Microscopy Observation of Individual Boron Dopant Atoms beneath Si(001)-2×1 Surfaces
- Observation of Hydrogenated Silicon Clusters Si_6H_x with Controlled Hydrogen Content on Si (111)-(7×7) Surfaces
- Observation of Hydrogenated Silicon Clusters Si6Hx with Controlled Hydrogen Content on Si (111)-($7\times 7$) Surfaces