Liu Y. | National Laboratory Of Solid State Microstructrues And Department Of Physics Nanjing University
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概要
- 同名の論文著者
- National Laboratory Of Solid State Microstructrues And Department Of Physics Nanjing Universityの論文著者
関連著者
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Liu Y.
National Laboratory Of Solid State Microstructrues And Department Of Physics Nanjing University
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WANG Mu
National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University
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Wang Mu
National Laboratory Of Solid State Microstructures And Department Of Physics Nanjing University:inte
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Wang M
National Laboratory Of Solid State Microstructrues And Department Of Physics Nanjing University
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LIU Y.
National Laboratory of Solid State Microstructrues and Department of Physics, Nanjing University
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PENG R.
National Laboratory of Solid State Microstructrues and Department of Physics, Nanjing University
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HUANG X.
National Laboratory of Solid State Microstructrues and Department of Physics, Nanjing University
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HU A.
National Laboratory of Solid State Microstructrues and Department of Physics, Nanjing University
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JIANG S.
National Laboratory of Solid State Microstructrues and Department of Physics, Nanjing University
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Hu A
National Laboratory Of Solid State Microstructrues And Department Of Physics Nanjing University
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Matsukawa T.
Nanoelectronics Research Institiute Aist
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MATSUKAWA T.
National Institute of Advanced Industrial Science and Technology (AIST)
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ENDO K.
National Institute of Advanced Industrial Science and Technology (AIST)
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MASAHARA M.
National Institute of Advanced Industrial Science and Technology (AIST)
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ISHII K.
National Institute of Advanced Industrial Science and Technology (AIST)
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YAMAUCHI H.
National Institute of Advanced Industrial Science and Technology (AIST)
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SUZUKI E.
National Institute of Advanced Industrial Science and Technology (AIST)
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Liu Y.-x.
Nanoelectronics Research Institiute Aist
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Masahara M.
Nanoelectronics Research Institiute Aist
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Suzuki E.
Nanoelectronics Research Institiute Aist
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Jiang S.
National Laboratory Of Solid State Microstructrues And Department Of Physics Nanjing University
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Matsukawa T.
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Huang X.
National Laboratory Of Solid State Microstructrues And Department Of Physics Nanjing University
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Takashima H.
School Of Science And Technology Meiji University
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Yamauchi H.
Nanoelectronics Research Institiute Aist
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Yokoyama H.
Nanoelectronics Research Institute Aist
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Endo K.
Nanoelectronics Research Institiute Aist
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Peng R.
National Laboratory Of Solid State Microstructrues And Department Of Physics Nanjing University
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Iwama N.
Daido Inst. Tech.
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Ishikawa Y.
National Cardiovascular Center
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HAYASHIDA T.
School of Science and Technology, Meiji University
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SAKAMOTO K.
National Institute of Advanced Industrial Science and Technology (AIST)
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TSUKADA J.
National Institute of Advanced Industrial Science and Technology (AIST)
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OGURA A.
School of Science and Technology, Meiji University
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TSUKADA J.
Nanoelectronics Research Institiute, AIST
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SUGIMATA E.
National Institute of Advanced Industrial Science and Technology (AIST)
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TAKASHIMA H.
National Institute of Advanced Industrial Science and Technology (AIST)
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O'uchi S.
National Institute Of Advanced Industrial Science And Technology (aist)
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Wang Mu
National Laboratory of Solid State Microstructrues and Department of Physics, Nanjing University
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KONOSHIMA S.
Japan Atomic Energy Agency, Naka Fusion Institute, Naka 311-0193, Japan
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TAMURA N.
National Institute for Fusion Science, Toki 509-5292, Japan
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PETERSON B.
National Institute for Fusion Science, Toki 509-5292, Japan
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IWAMA N.
Daido Institute of Technology, Nagoya 457-8530, Japan
著作論文
- Absence of Suppression in the Persistent Current by Delocalization in Random-dimer Mesoscopic Rings
- Absence of Suppression in the Persistent Current by Delocalization in Random-dimer Mesoscopic Rings
- TiN Gate Work Function Control Using Nitrogen Gas Flow Ratio and RTA-Temperature
- Carrier Mobility in Multi-FinFETs with a (111) Channel Surface Fabricated by Orientation-Dependent Wet Etching
- Application of Tomographic Imaging to Multi-pixel Bolometric Measurements