Ng Geok | Microelectronics Centre School Of Electrical And Electronics Engineering Nanyang Technological Unive
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- 同名の論文著者
- Microelectronics Centre School Of Electrical And Electronics Engineering Nanyang Technological Univeの論文著者
Microelectronics Centre School Of Electrical And Electronics Engineering Nanyang Technological Unive | 論文
- DC Characterization of Metamorphic InP/InGaAs Heterojunction Bipolar Transistors at Elevated Temperature
- Studies on the Degradation of InP/InGaAs/InP Double Heterojunction Bipolar Transistors Induced by Silicon Nitride Passivation
- A High Sensitivity, Phase Sensitive d_ Meter for Complex Piezoelectric Constant Measurement
- A Unified Chemical Bonding Model for Defect Generation in a-SiH: Photo-Induced Defects in Photovoltaic Devices and Current-Induced Defects in TFTs.
- Experimental Determination of Ultrathin Oxide Thickness Using Conventional Capacitance-Voltage Analysis