Shinoda Yukinobu | Musashino Electrical Communication Laboratory
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概要
関連著者
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Shinoda Yukinobu
Musashino Electrical Communication Laboratory
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SHINODA Yukinobu
Musashino Electrical Communication Laboratory Nippon Telegraph and Telephone Public Corporation
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Kawakami Tsuyoshi
Musashino Electrical Communication Laboratory N. T. T.
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Kawakami Tsuyoshi
Musashino Electrical Communication Laboratory
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KOBAYASHI Takeshi
Musashino Electrical Communication Laboratory, N.T.T.
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Kobayashi Takeshi
Musashino Electrical Communication Laboratories N.t.t.
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KOMIYA Satoshi
Fujitsu Laboratories Ltd.
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Komiya Satoshi
Fujitsu Laboratories Lid.
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Ohmachi Yoshiro
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Nishida Katsuhiko
Central Research Laboratories Nippon Electric Co. Ltd.
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Nishida Katsuhiko
Central Research Laboratories Nippon Electric Co. Lid.
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Nishioka Takashi
Musashino Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation
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Okamura Masamichi
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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Yamaguchi Eiichi
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation
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Wakita Koichi
Musashino Electrical Communication Laboratory N.t.t.
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Wakita Koichi
Musashino Electrical Communication Laboratory N. T. T.
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Okamura Masamichi
Musashino Electrical Communication Laboratory N.t.t.
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Kamejima Taibun
Central Research Laboratories Nippon Electric Co. Ltd.
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Kamejima Taibun
Central Research Labolatories Nippon Electric Co. Lid.
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KAWAKAMI Tsuyoshi
Musashino Electrical Communication Laboratory, N. T. T.
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FUJIWARA Takao
Fujitsu Laboratories Ltd.
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Shinoda Yukinobu
Musashino Electrical Communication Laboratory N.t.t.
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Shinoda Yukinobu
Musashino Electrical Communication Laboratory N. T. T.
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Fujiwara Takao
Fujitsu Laboratories Limited
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Yamaguchi Eiichi
Musashino Electrical Communication Laboratory N.t.t.
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Kobayashi Takeshi
Musashino Electrical Communication Laboratory N.t.t.
著作論文
- GaAs Light Emitting Diodes Fabricated on SiO_2/Si Wafers
- InGaAsP n-Channel Inversion-Mode MISFET
- Life Test of GaAs DH Lasers at Room Temperature
- Rapid Degradation in GaAs/AlGaAs Lasers Caused by Process-Induced Defects
- CVD Al_2O_3 Films on III-V Binary Semiconductors
- Evaluation of GaAs/AlGaAs Double-Heterostructure Wafers and Lasers by X-ray Topography
- X-Ray Topographic Observations of Defects on the Interface of GaAs-Al_xGa_1-xAs Epitaxial Wafers