Lee Tung-hsing | Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
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Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No. | 論文
- Mechanism of Chemical Mechanical Planarization Induced Edge Corrosion of Copper Line for Cu/Low-k SiOC Interconnects
- Effects of hot carriers on DC and RF performances of deep submicron PMOSFET for low-power and high frequency applications
- The Growth and Characterization of Silicon/Silicon Carbide Heteroepitaxial Films on Silicon Substrates by Rapid Thermal Chemical Vapor Deposition
- A Comparison of Behaviors between Hydrogenated/Unhydrogenated Polysilicon Thin Film Transistors under Electric Stress
- Improvement on Fluorine Effect under High Field Stress in Tungsten-Polycide Gated Metal-Oxide-Semiconductor Field-Effect Transistor with Oxynitride and/or Reoxidized-Oxynitride Gate Dielectric