Takeoka Sadami | Semiconductor Company Matsushita Electric Industrial Co. Ltd.
スポンサーリンク
概要
関連著者
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Takeoka Sadami
Semiconductor Company Matsushita Electric Industrial Co. Ltd.
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FUKUNAGA Masayasu
Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology
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Fukunaga Masayasu
Graduate School Of Computer Science And Systems Engineering Kyushu Institute Of Technology
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KAJIHARA Seiji
Department of Computer Science and Electronics of Kyushu Institute of Technology
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Kajihara S
Kyushu Inst. Technol. Iizuka‐shi Jpn
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Kajihara Seiji
Graduate School Of Computer Science And Systems Engineering Kyushu Institute Of Technology:center Fo
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Motohara Akira
Semiconductor Research Center Matsushita Electric Industrial Co. Ltd.
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Ohta Mitsuyasu
Semiconductor Research Center Matsushita Electric Industrial Co. Ltd.
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MURAOKA Michiaki
Semiconductor Technology Academic Research Center
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TAKEOKA Sadami
Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd.
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Takeoka Sadami
Semiconductor Research Center Matsushita Electric Industrial Co. Ltd.
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Muraoka Michiaki
Semiconductor Research Center Matsushita Electric Industrial Co. Ltd.
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YOSHIMURA Shinichi
Semiconductor Company, Matsushita Electric Industrial Co., Ltd.
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Yoshimura Shinichi
Semiconductor Company Matsushita Electric Industrial Co. Ltd.
著作論文
- A Partial Scan Design Approach based on Register-Transfer Level Testability Analysis (Special Issue on Synthesis and Verification of Hardware Design)
- On Statistical Estimation of Fault Efficiency for Path Delay Faults Based on Untestable Path Analysis(Dependable Computing)
- Evaluation of Delay Testing Based on Path Selection(Timing Verifivation and Test Generation)(VLSI Design and CAD Algorithms)