YOSHIMURA Shinichi | Semiconductor Company, Matsushita Electric Industrial Co., Ltd.

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概要

関連著者

Kajihara Seiji
Graduate School Of Computer Science And Systems Engineering Kyushu Institute Of Technology:center Fo
Takeoka Sadami
Semiconductor Company Matsushita Electric Industrial Co. Ltd.
FUKUNAGA Masayasu
Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology
YOSHIMURA Shinichi
Semiconductor Company, Matsushita Electric Industrial Co., Ltd.
Fukunaga Masayasu
Graduate School Of Computer Science And Systems Engineering Kyushu Institute Of Technology
Yoshimura Shinichi
Semiconductor Company Matsushita Electric Industrial Co. Ltd.

著作論文

Evaluation of Delay Testing Based on Path Selection(Timing Verifivation and Test Generation)(VLSI Design and CAD Algorithms)

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