Sawada Daisuke | Graduate School Of Engineering Osaka University

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概要

• Sawada Daisukeの詳細を見る
• 同名の論文著者
• Graduate School Of Engineering Osaka Universityの論文著者

関連著者

• Sugimoto Yoshiaki

  Graduate School Of Engineering Osaka University

• Abe Masayuki

  Graduate School Of Engineering Osaka University

• Morita Seizo

  Graduate School Of Engineering Osaka University

• Sawada Daisuke

  Graduate School Of Engineering Osaka University

• 森田 清三

  大阪大学大学院工学研究科

• Morita S

  Faculty Of Engineering Osaka University

• Morita S

  Osaka Univ. Osaka

• Morita Shigenori

  Department Of Electronic Engineering Osaka University

• Mishima Syuzo

  Research Department Olympus Optical Co. Ltd.

• SAWADA Daisuke

  Graduate School of Engineering, Osaka University

• HIRAI Akira

  Graduate School of Engineering, Osaka University

• SUGIMOTO Yoshiaki

  Graduate School of Engineering, Osaka University

• ABE Masayuki

  Graduate School of Engineering, Osaka University

• MORITA Seizo

  Graduate School of Engineering, Osaka University

• Hirai Akira

  Graduate School Of Engineering Osaka University

• Abe Masayuki

  Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan

• Namikawa Takashi

  Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan

• Hiragaki Masuhiro

  Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan

• Sugimoto Yoshiaki

  Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan

• Sawada Daisuke

  Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan

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著作論文

• Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
• Observation of Subsurface Atoms of the Si(111)-($7{\times}7$) Surface by Atomic Force Microscopy
• High-Spatial-Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2$\times$1) Using Noncontact Atomic Force Microscopy

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