LIU Sally | Taiwan Semiconductor Manufacturing Company
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概要
関連著者
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LIU Sally
Taiwan Semiconductor Manufacturing Company
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Su Pin
Department Of Electronics Engineering National Chiao Tung University
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Su Ke-wei
Taiwan Semiconductor Manufacturing Company
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CHIANG Chung-Shi
Taiwan Semiconductor Manufacturing Company
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Yeh Tzu-jin
Taiwan Semiconductor Manufacturing Company
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YANG Ming-Ta
Taiwan Semiconductor Manufacturing Company
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Lee Wei
Department Of Electrical Engineering Tamkang University
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LEE Wei
Department of Electronics Engineering, National Chiao Tung University
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Hsu Shawn
Department Of Electrical Engineering And Computer Science The University Of Michigan
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Hsu Shawn
Dept. Of Electrical Engineering And Institute Of Electronics Engineering National Tsing Hua Universi
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JIN Jun-De
Dept. of Electrical Engineering and Institute of Electronics Engineering, National Tsing Hua Univers
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Jin Jun-de
Dept. Of Electrical Engineering And Institute Of Electronics Engineering National Tsing Hua Universi
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Hsu Shawn
Department of Electrical Engineering and Institute of Electronics Engineering, National Tsing Hua University, 101, Sec. 2, Kuang-Fu Rd., Hsinchu, Taiwan 300, R.O.C.
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Jin Jun-De
Department of Electrical Engineering and Institute of Electronics Engineering, National Tsing Hua University, 101, Sec. 2, Kuang-Fu Rd., Hsinchu, Taiwan 300, R.O.C.
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Su Ke-Wei
Taiwan Semiconductor Manufacturing Company, 9, Creation Rd. 1, Science-Based Industrial Park, Hsinchu, Taiwan 300, R.O.C.
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Su Pin
Department of Electronics Engineering, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu, Taiwan 300, R.O.C.
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Lee Wei
Department of Electronics Engineering, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu, Taiwan 300, R.O.C.
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Yang Ming-Ta
Taiwan Semiconductor Manufacturing Company, 9, Creation Rd. 1, Hsinchu Science Park, Hsinchu, Taiwan 300-77, R.O.C.
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Liu Sally
Taiwan Semiconductor Manufacturing Company, 9, Creation Rd. 1, Science-Based Industrial Park, Hsinchu, Taiwan 300, R.O.C.
著作論文
- Investigation of Inversion C-V Reconstruction for Long-Channel MOSFETs with Leaky Dielectrics using Intrinsic Input Resistance Approach
- Fully Analytical Modeling of Cu Interconnects Up to 110GHz
- Investigation of Inversion Capacitance–Voltage Reconstruction for Metal Oxide Semiconductor Field Effect Transistors with Leaky Dielectrics using BSIM4/SPICE and Intrinsic Input Resistance Model
- Fully Analytical Modeling of Cu Interconnects up to 110 GHz