Wang Chao-chun | Department Of Electronics Engineering National Chiao-tung University
スポンサーリンク
概要
関連著者
-
CHEN Mao-Chieh
Department of Electronics Engineering & The Institute of Electronics, National Chiao Tung University
-
Wang Chao-chun
Department Of Electronics Engineering National Chiao-tung University
-
Lin Hsin-hung
Department Of Electronics Engineering National Chiao-tung University
-
Wu Wei-hao
Department Of Electronics Engineering And Institute Of Electronics National Chiao-tung University
-
Wu You-Kuo
Department of Electronics Engineering, National Chiao-Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan
-
Wu Wei-Hao
Department of Electronics Engineering, National Chiao-Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan
-
Lin Hsin-Hung
Department of Electronics Engineering, National Chiao-Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan
-
Wang Chao-Chun
Department of Electronics Engineering, National Chiao-Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan
著作論文
- Thermal Stability of Cu/NiSi-Contacted p+n Shallow Junction
- Formation of NiSi-Silicided p+n Shallow Junctions by BF2+ Implantation into/through Silicide and Rapid Thermal Annealing
- Formation and Characterization of NiSi-Silicided n+p Shallow Junctions