Takenaka Mitsuru | School Of Engineering The University Of Tokyo

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概要

• TAKENAKA Mitsuruの詳細を見る
• 同名の論文著者
• School Of Engineering The University Of Tokyoの論文著者

関連著者

• Takenaka Mitsuru

  School Of Engineering The University Of Tokyo

• Sugahara Satoshi

  Graduate School Of Frontier Science The Univ. Of Tokyo

• KUMAGAI Hiroshi

  Graduate School of Frontier Science, The Univ. of Tokyo

• Nakane Ryosho

  School Of Engineering The Univ. Of Tokyo

• Sugahara Satoshi

  Graduate School Of Science And Technology Tokyo Institute Of Technology

• MATSUBARA Hiroshi

  Graduate School of Frontier Science, The Univ. of Tokyo

• TAKAGI Shin-ichi

  Graduate School of Frontier Science, The University of Tokyo

• Kumagai Hiroshi

  Graduate School Of Frontier Science The University Of Tokyo

• Kumagai Hiroshi

  Graduate School Of Frontier Science The Univ. Of Tokyo

• Matsubara Hiroshi

  Graduate School Of Frontier Science The University Of Tokyo

• Matsubara Hiroshi

  Graduate School Of Frontier Science The Univ. Of Tokyo

• Takagi Shin-ichi

  Graduate School Of Frontier Science The University Of Tokyo

• Sugahara Satoshi

  Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8503, Japan

• Takagi Shinichi

  School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan

• Morii Kiyohito

  School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan

• Dissanayake Sanjeewa

  School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan

• Tanabe Satoshi

  School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan

• Weber Olivier

  School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo, Tokyo 113-0032, Japan

• Takagi Shin-ichi

  School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo, Tokyo 113-0032, Japan

• Takenaka Mitsuru

  School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo, Tokyo 113-0032, Japan

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著作論文

• Evaluation of Electron and Hole Mobility at Identical Metal–Oxide–Semiconductor Interfaces by using Metal Source/Drain Ge-on-Insulator Metal–Oxide–Semiconductor Field-Effect Transistors
• Experimental Determination of Shear Stress induced Electron Mobility Enhancements in Si and Biaxially Strained-Si Metal–Oxide–Semiconductor Field-Effect Transistors
• Evaluation of SiO_2/GeO_2/Ge MIS Interface Properties by Low Temperature Conductance Method

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