Takenoshita Hiroshi | Faculty Of Education Nagasaki University
スポンサーリンク
概要
関連著者
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Takenoshita Hiroshi
Faculty Of Education Nagasaki University
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Kobayashi Mutsuo
Mitsubishi Electric Engineering Co. Ltd.
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Takenoshita Hiroshi
Faculty of Education, Nagasaki University
著作論文
- Nondestructive Internal Observation in Electron-Acoustic Microscopy Using Metal-Oxide-Semiconductor LSI Chip
- Nondestructive Internal Observation of Metal-Oxide-Semiconductor LSI Designed by 0.8μm Rule
- Comparative Study of Scanning Electron Microscopy and Electron-Acoustic Microscopy Images(Semiconductors)
- Observation of Oxidation-Induced Stacking Faults by Electron-Acoustic Microscopy