Lee Yeong | Dept. Of Eecs Korea Advanced Institute Of Science And Technology
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概要
Dept. Of Eecs Korea Advanced Institute Of Science And Technology | 論文
- Investigation of Gate Misalignment Effects in FinFETs(Session 7A Silicon Devices IV,AWAD2006)
- Investigation of Gate Misalignment Effects in FinFETs(Session 7A Silicon Devices IV,AWAD2006)
- A Comprehensive Study of Hot-Carrier Effects in Body-Tied FinFETs
- A Comprehensive Study of Hot-Carrier Behaviors with Consideration of Non-Local, Series Resistance, Quantum, and Temperature Effects in Multi-Gate FinFETs
- Novel Structures for a 2-Bit per Cell of Nonvolatile Memory Using an Asymmetric Double Gate(Si Devices and Processes,Fundamental and Application of Advanced Semiconductor Devices)