Huang Tsung-yi | Institute Of Electronic Engineering National Tsing Hua University

スポンサーリンク

概要

• HUANG Tsung-yiの詳細を見る
• 同名の論文著者
• Institute Of Electronic Engineering National Tsing Hua Universityの論文著者

関連著者

• Huang Jei-feng

  Taiwan Semiconductor Manufacturing Company Ltd.

• Wu Meng-chyi

  Institute Of Electronic Engineering National Tsing Hua University

• Lee Hung-chun

  Industrial Technology Research Institute

• Lee Li-ling

  Industrial Technology Research Institute

• Chen Shih-hui

  Institute Of Electronic Engineering National Tsing Hua University

• LIOU Ruey-hsin

  Taiwan Semiconductor Manufacturing Company Ltd.

• HSU Shun-liang

  Taiwan Semiconductor Manufacturing Company Ltd.

• Gong Jeng

  Institute Of Electronic Engineering National Tsing Hua University

• Huang Tsung-yi

  Institute Of Electronic Engineering National Tsing Hua University

• WU Meng-Chyi

  Institute of Electronics Engineering, National Tsing Hua University

• GONG Jeng

  Institute of Electronic Engineering, National Tsing Hua University

• HUANG Tsung-yi

  Institute of Electronic Engineering, National Tsing Hua University

• Huang Tsung-yi

  Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.

• Lee Li-ling

  Industrial Technology Research Institute, Hsinchu 310, Taiwan, R.O.C.

• Chen Shih-hui

  Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.

• Wu Meng-chyi

  Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.

• Liou Ruey-hsin

  Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu 300, Taiwan, R.O.C.

• Lee Hung-chun

  Industrial Technology Research Institute, Hsinchu 310, Taiwan, R.O.C.

もっと見る 閉じる

著作論文

• Time-Dependent Drain- and Source-Series Resistance of High-Voltage Lateral Diffused Metal-Oxide-Semiconductor Field-Effect Transistors during Hot-Carrier Stress
• Time-Dependent Drain- and Source-Series Resistance of High-Voltage Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors during Hot-Carrier Stress

スポンサーリンク