LIOU Ruey-hsin | Taiwan Semiconductor Manufacturing Company Ltd.
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概要
関連著者
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Huang Jei-feng
Taiwan Semiconductor Manufacturing Company Ltd.
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Wu Meng-chyi
Institute Of Electronic Engineering National Tsing Hua University
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Lee Hung-chun
Industrial Technology Research Institute
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Lee Li-ling
Industrial Technology Research Institute
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Chen Shih-hui
Institute Of Electronic Engineering National Tsing Hua University
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LIOU Ruey-hsin
Taiwan Semiconductor Manufacturing Company Ltd.
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HSU Shun-liang
Taiwan Semiconductor Manufacturing Company Ltd.
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Gong Jeng
Institute Of Electronic Engineering National Tsing Hua University
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Huang Tsung-yi
Institute Of Electronic Engineering National Tsing Hua University
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WU Meng-Chyi
Institute of Electronics Engineering, National Tsing Hua University
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GONG Jeng
Institute of Electronic Engineering, National Tsing Hua University
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HUANG Tsung-yi
Institute of Electronic Engineering, National Tsing Hua University
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Huang Tsung-yi
Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.
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Lee Li-ling
Industrial Technology Research Institute, Hsinchu 310, Taiwan, R.O.C.
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Chen Shih-hui
Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.
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Wu Meng-chyi
Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.
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Liou Ruey-hsin
Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu 300, Taiwan, R.O.C.
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Lee Hung-chun
Industrial Technology Research Institute, Hsinchu 310, Taiwan, R.O.C.
著作論文
- Time-Dependent Drain- and Source-Series Resistance of High-Voltage Lateral Diffused Metal-Oxide-Semiconductor Field-Effect Transistors during Hot-Carrier Stress
- Time-Dependent Drain- and Source-Series Resistance of High-Voltage Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors during Hot-Carrier Stress