Chen Shih-hui | Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.

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概要

• Chen Shih-huiの詳細を見る
• 同名の論文著者
• Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.の論文著者

関連著者

• Huang Jei-feng

  Taiwan Semiconductor Manufacturing Company Ltd.

• Wu Meng-chyi

  Institute Of Electronic Engineering National Tsing Hua University

• Lee Hung-chun

  Industrial Technology Research Institute

• Lee Li-ling

  Industrial Technology Research Institute

• Chen Shih-hui

  Institute Of Electronic Engineering National Tsing Hua University

• LIOU Ruey-hsin

  Taiwan Semiconductor Manufacturing Company Ltd.

• HSU Shun-liang

  Taiwan Semiconductor Manufacturing Company Ltd.

• Gong Jeng

  Institute Of Electronic Engineering National Tsing Hua University

• Huang Tsung-yi

  Institute Of Electronic Engineering National Tsing Hua University

• Huang Tsung-yi

  Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.

• Lee Li-ling

  Industrial Technology Research Institute, Hsinchu 310, Taiwan, R.O.C.

• Chen Shih-hui

  Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.

• Wu Meng-chyi

  Institute of Electronic Engineering, National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.

• Liou Ruey-hsin

  Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu 300, Taiwan, R.O.C.

• Lee Hung-chun

  Industrial Technology Research Institute, Hsinchu 310, Taiwan, R.O.C.

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著作論文

• Time-Dependent Drain- and Source-Series Resistance of High-Voltage Lateral Diffused Metal–Oxide–Semiconductor Field-Effect Transistors during Hot-Carrier Stress

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