Ishibashi T | Mitsubishi Electric Co. Ltd. Hyogo Jpn
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概要
Mitsubishi Electric Co. Ltd. Hyogo Jpn | 論文
- Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1102) substrate using convergent-beam electron diffraction
- Lattice parameter determination of a composition controlled Si_Ge_x layer on a Si (001) substrate using convergent-beam electron diffraction
- Lattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBED
- Site-Specific Studies on X-Ray Magnetic Circular Dichroism at Fe K Edge for Transition-Metal Ferrites
- X-Ray Diffuse Scattering Study of Magnetite by the Valence-Difference Contrast Method