Dong M | School Of Electrical And Computer Engineering Cornell University
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School Of Electrical And Computer Engineering Cornell University | 論文
- Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors(Session 6B : Wide Bandgap Materials and Devices, Power Devices)
- Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors(Session 6B : Wide Bandgap Materials and Devices, Power Devices)
- Strain Effects in van der Pauw (VDP) Stress Sensor Fabricated on (111) Silicon
- Design Consideration of High Power LED Arrays for Backlight Unit Applications(Session8B: High-Frequency, Photonic and Sensing Devices)
- Strain effects in resistor stress sensor fabricated on (001) silicon and their influences on the determination of piezoresistive coefficients(Session 6A : TFTs and Sensors)