Bearda Twan | Interuniversity Microelectronics Center

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• 同名の論文著者
• Interuniversity Microelectronics Centerの論文著者

Interuniversity Microelectronics Center | 論文

• Stress in Thin Micro-Zone-Molten Crystalline Silicon Films on Solid Substrates
• Current-Voltage Characteristics of Gate Oxides after Hard Breakdown
• Morphology Change of Artificial Crystal Originated Particles, and the Effect on Gate Oxide Integrity
• Breakdown and Recovery of Thin Gate Oxides
• Fabrication and Characterization of Artificial Crystal Originated Particles

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