Ryu B | Electronics And Telecommunications Res. Inst. Daejon Kor
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概要
Electronics And Telecommunications Res. Inst. Daejon Kor | 論文
- Formation of Ferroelectric Thin Films for MFIS or MFMIS Structure
- Formation of Ferroelectric Thin Films for MFIS or MFMIS Structure
- Characterizations of Ferroelectric Transistors with BaMgF_4 Dielectric
- Characterizations of Ferroelectric Transistors with BaMgF_4 Dielectric
- A Low Operating Voltage(3V) Metal-Ferroelectric-Semiconductor(MFS)FET's Using LiNbO_3/Si(100)Structures For Nonvolatile Memory Application