Huang Ru | Institute Of Microelectronics Peking University

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概要

• HUANG Ruの詳細を見る
• 同名の論文著者
• Institute Of Microelectronics Peking Universityの論文著者

関連著者

• Huang Ru

  Institute Of Microelectronics Peking University

• Wang Yangyuan

  Institute Of Microelectronics Peking University

• Tang Poren

  Institute of Microelectronics, Peking University, Beijing 100871, China

• Wu Dake

  Institute of Microelectronics, Peking University, Beijing 100871, China

• Oka H

  Central Research Laboratories Zeria Pharmaceutical Co. Ltd.

• OKA Hideki

  Fujitsu Laboratories Ltd.

• ZHANG Xing

  Institute of Advanced Material Study, Kyushu University

• Oka Hideki

  Fujitsu Laboratories Ltd

• Yu Min

  Institute of Atomic Energy, Academia Sinica

• HUANG Ru

  Institute of Microelectronics,Peking University

• WANG Yangyuan

  Institute of Microelectronics,Peking University

• Zhang X

  Institute Of Microelectronics Peking University

• Zhang Xing

  Institute Of Advanced Material Study Kyushu University

• Yu Min

  Institute Of Atomic Energy Academia Sinica

• Yu Min

  Institute Of Microelectronics Peking University

• Dake Wu

  Institute of Microelectronics, Peking University, Beijing 100871, China

• Poren Tang

  Institute of Microelectronics, Peking University, Beijing 100871, China

• Wang Runsheng

  Institute of Microelectronics, Peking University, Beijing 100871, P. R. China

• Yu Tao

  Institute of Microelectronics, Peking University, Beijing 100871, P. R. China

• Ru Huang

  Institute of Microelectronics, Peking University, Beijing 100871, China

• Huang Ru

  Institute of Microelectronics, Peking University, Beijing 100871, P. R. China

• Yangyuan Wang

  Institute of Microelectronics, Peking University, Beijing 100871, China

• Wang Yangyuan

  Institute of Microelectronics, Peking University, Beijing 100871, P. R. China

• Ding Wei

  Institute of Microelectronics, Peking University, Beijing 100871, P. R. China

• Yilin Zhang

  Institute of Microelectronics, Peking University, Beijing 100871, China

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著作論文

• Atomistic Simulation of RTA Annealing for Shallow Junction Formation Characterizing both BED and TED(the IEEE International Conference on SISPAD '02)
• New Observations and Impacts of Diameter-Dependent Annealing Effects in Silicon Nanowire Transistors
• Performance Improvement of Capacitorless Dynamic Random Access Memory Cell with Band-Gap Engineered Source and Drain
• High Density Capacitorless Dynamic Random Access Memory Cell with Quasi Silicon-on-Insulator Structure Based on Bulk Substrate

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