Watanabe Koji | Silicon Systems Research Laboratories, NEC Corporation
スポンサーリンク
概要
関連著者
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Watanabe Koji
Silicon Systems Research Laboratories, NEC Corporation
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Watanabe Koji
Silicon Systems Research Laboratories Nec Corporation
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TATSUMI Toru
Silicon Systems Research Laboratories, NEC Corporation
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Tatsumi Toru
Silicon Systems Research Laboratories Nec Corporation
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Kimura Shigeru
Silicon Systems Research Laboratories, NEC Corporation
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Ikarashi Nobuyuki
Silicon Systems Research Laboratories Nec Corporation
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Kimura Shigeru
Silicon Systems Research Laboratories Nec Corporation
著作論文
- Ultrathin Oxide Film Formation Using Radical Oxygen in an Ultrahigh Vacuum System
- Quantitative Characterization of Roughness at SiO_2/Si Interfaces by Using Cross-sectional High-resolution Transmission Electron Microscopy