Nakazato N | Hitachi Ltd. Tsuchiura‐shi Jpn
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概要
Hitachi Ltd. Tsuchiura‐shi Jpn | 論文
- Strain Imaging of Lead-Zirconate-Titanate Thin Film by Tunneling Acoustic Microscopy
- Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
- Hydrogen-related Degradation and Recovery Phenomena in Pb(Zr,Ti)O_3 Capacitors with a Platinum Electrode
- Highly Oxidation-Resistant TiN Barrier Layers for Ferroelectric Capacitors
- Effects of Post-Annealing Temperatures and Ambient Atmospheres on the Electrical Properties of Ultrathin (Ba, Sr) TiO_3 Capacitors