Deng I-chung | Department Of Electronic Engineering Kuang Wu Institute Of Technology
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概要
関連著者
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Deng I-chung
Department Of Electronic Engineering Kuang Wu Institute Of Technology
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Chang Kow-ming
Department Of Electronic Engineering And Institute Of Electronics National Chiao Tung University And
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Fu C‐m
Department Of Physics National Kaohsiung Normal University
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Fu Chao-ming
Department Of Physics National Kao Hsiung Normal University
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LAIN Kuen-Der
Department of Physics, National Kaohsiung Normal University
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Deng I‐c
Kuang Wu Inst. Technol. Taipei Twn
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Lain Kuen-der
Department Of Physics National Kaohsiung Normal University
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FU Chao-Ming
Department of Physics, National Kao Hsiung Normal University
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CHANG Kow-Ming
Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University
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Yeh Ta-hsun
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University An
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DENG I-Chung
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University a
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SHIH Chieh-Wen
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University a
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Shih Chieh-wen
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University An
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Deng I-Chung
Department of Electronic Engineering, Kuang Wu Institute of Technology, Taipei 112, Taiwan, R.O.C.
著作論文
- Thermal Stability of Amorphous-like WN_x/W Bilayered Diffusion Barrier for Chemical Vapor Deposited-Tungsten/p^+-Si Contact System
- The Characteristics of Chemical Vapor Deposited Amorphous-like Tungsten Film as a Gate Electrode
- Application of In-Situ Nitrogen Plasma Treated Amorphous-like Tungsten Silicide Film as Barrier Material in the Application of Copper Gate Electrode
- Suppress Copper Diffusion through Barrier Metal-Free Structure by Implantation of Nitrogen Atom into Low-$K$ Material