Matsuura Ryo | Department Of Electronics Kyushu University
スポンサーリンク
概要
関連著者
-
Sadoh Taizoh
Department Of Electronics Faculty Of Engineering Kyushu University
-
Matsuura Ryo
Department Of Electronics Kyushu University
-
SADOH Taizoh
Department of Electronics, Kyushu University
-
Sadoh Taizoh
Department Of Electronics Kyushu University
-
MATSUURA Ryo
Department of Electronics, Kyushu University
-
NINOMIYA M.
SUMCO
-
NAKAMAE M.
SUMCO
-
ENOKIDA T.
Fukuryo Semicon Engineering
-
HAGINO H.
Fukuryo Semicon Engineering
-
MIYAO M.
Department of Electronics, Kyushu University
-
NINOMIYA Masaharu
SUMCO
-
NAKAMAE Masahiko
SUMCO
-
HAGINO Hiroyasu
Analysis & Evaluation Center, Fukuryo Semicon Engineering Corporation
-
Miyao Masanobu
Department Of Electronics Kyushu University
-
Enokida Toyotsugu
Analyses Of Evaluation Center Fukuryo Semicon Engineering Corporation
-
Miyao M.
Department Of Electronics Kyushu University
-
Hagino Hiroyasu
Analysis & Evaluation Center, Fukuryo Semicon Engineering Corporation, 1-1-1 Imajuku-Higashi, Fukuoka 819-0192, Japan
-
Sadoh Taizoh
Department of Electronics, Kyushu University, 6-10-1 Hakozaki, Fukuoka 812-8581, Japan
-
Matsuura Ryo
Department of Electronics, Kyushu University, 6-10-1 Hakozaki, Fukuoka 812-8581, Japan
-
Nakamae Masahiko
SUMCO, 2201 Oaza Kamioda, Kohoku-cho, Kishima-gun, Saga 849-0597, Japan
著作論文
- Improvement of Oxidation-Induced Ge Condensation Method by H^+ Implantation and Two-Step Annealing for Highly Stress-Relaxed SGOI
- Improvement of Oxidation-Induced Ge Condensation Method by H+ Implantation and Two-Step Annealing for Highly Stress-Relaxed SiGe-on-Insulator