HAGINO Hiroyasu | Analysis & Evaluation Center, Fukuryo Semicon Engineering Corporation

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概要

• 同名の論文著者
• Analysis & Evaluation Center, Fukuryo Semicon Engineering Corporationの論文著者

関連著者

• NINOMIYA Masaharu

  SUMCO

• NAKAMAE Masahiko

  SUMCO

• HAGINO Hiroyasu

  Analysis & Evaluation Center, Fukuryo Semicon Engineering Corporation

• SADOH Taizoh

  Department of Electronics, Kyushu University

• MIYAO Masanobu

  Department of Electronics, Kyushu University

• Sadoh Taizoh

  Department Of Electronics Kyushu University

• Sadoh Taizoh

  Department Of Electronics Faculty Of Engineering Kyushu University

• MATSUURA Ryo

  Department of Electronics, Kyushu University

• ENOKIDA Toyotsugu

  Analyses of Evaluation Center, Fukuryo Semicon Engineering Corporation

• Miyao Masanobu

  Department Of Electronics Kyushu University

• Miyao M

  Department Of Electronics Kyushu University

• Matsuura Ryo

  Department Of Electronics Kyushu University

• Enokida Toyotsugu

  Analyses Of Evaluation Center Fukuryo Semicon Engineering Corporation

• Hagino Hiroyasu

  Analysis & Evaluation Center, Fukuryo Semicon Engineering Corporation, 1-1-1 Imajuku-Higashi, Fukuoka 819-0192, Japan

• Sadoh Taizoh

  Department of Electronics, Kyushu University, 6-10-1 Hakozaki, Fukuoka 812-8581, Japan

• Matsuura Ryo

  Department of Electronics, Kyushu University, 6-10-1 Hakozaki, Fukuoka 812-8581, Japan

• Nakamae Masahiko

  SUMCO, 2201 Oaza Kamioda, Kohoku-cho, Kishima-gun, Saga 849-0597, Japan

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著作論文

• Improvement of Oxidation-Induced Ge Condensation Method by H^+ Implantation and Two-Step Annealing for Highly Stress-Relaxed SiGe-on-Insulator
• Improvement of Oxidation-Induced Ge Condensation Method by H+ Implantation and Two-Step Annealing for Highly Stress-Relaxed SiGe-on-Insulator

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