Fujiwara Osamu | The Department Of Electrical And Computer Engineering Nagoya Institute Of Technology
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概要
関連著者
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Fujiwara O
Nagoya Inst. Of Technol. Nagoya Jpn
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Fujiwara Osamu
The Department Of Electrical And Computer Engineering Nagoya Institute Of Technology
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Fujiwara Osamu
The Department Of Electrical And Computer Engineering Of Nagoya Institute Of Technology
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Fujiwara Osamu
The Faculty Of Engineering Nagoya Institute Of Technology
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Wang J
Nagoya Inst. Technol. Nagoya‐shi Jpn
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Wang Jianqing
The Department Of Computer Science And Engineering Graduate School Of Engineering Nagoya Institute O
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Wang Jianqing
The Department Of Electrical And Computer Engineering Nagoya Institute Of Technology
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Wang Jianqing
The Authors Are With The Department Of Electrical And Computer Engineering Nagoya Institute Of Techn
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Fujiwara Osamu
The Department Of Computer Science And Engineering Graduate School Of Engineering Nagoya Institute O
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Fujiwara Osamu
Faculty Of Engineering Nagoya Institute Of Technology
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Wang Jianqing
Department Of Computer Science And Engineering Nagoya Institute Of Technology
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Fujiwara Osamu
Department Of Electrical And Computer Engineering Nagoya Institute Of Technology
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Fujiwara Osamu
Department Of Computer Science And Engineering Graduate School Of Engineering Nagoya Institute Of Te
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Fujiwara Osamu
Nagoya Institute of Technology
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WANG Jianqing
Department of Computer Science and Engineering, Nagoya Institute of Technology
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FUJIWARA Osamu
Department of Computer Science and Engineering, Nagoya Institute of Technology
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Wang J
名古屋工大
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Wang Jianqing
Nagoya Institute Of Technology
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JOUKOU Takahiro
Nagoya Institute of Technology
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FUJIWARA Osamu
the Department of Electrical and Computer Engineering, Nagoya Institute of Technology
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Fujiwara Osamu
Department Of Computer Science And Engineering Nagoya Institute Of Technology
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Sasabe K
Matsushita Electric Works Ltd. Osaka‐shi Jpn
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Wang Jianqing
Nagoya Inst. Of Technol. Nagoya Jpn
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Nomura Michihiko
The Faculty of Engineering, Nagoya Institute of Technology
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YOSHIDA Kunio
Department of Mechanical Sciences and Engineering, Tokyo Institute of Technology
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Yoshida Kunio
Department Of Electronics Information And Communication Engineering Osaka Institute Of Technology
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Wang Jianqing
Department Of Electrical And Computer Engineering Nagoya Institute Of Technology
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Yoshida K
Renesas Technol. Corp. Itami‐shi Jpn
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Yoshida K
Osaka Institute Of Technology
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Fujiwara Osamu
Faculty of Engineering, Nagoya Institute of Technology
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Andoh Norio
Faculty of Engineering, Nagoya Institute of Technology
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Konishi Yusuke
Division Of Electric Electronic And Information Engineering Graduate School Of Engineering Osaka Uni
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ANDOH Naoto
Electro-Optics amp Microwave System Laboratory, MitsubishiElectric Corporation
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TSUCHIKAWA Tetsuji
the Department of Computer Science and Engineering, Graduate School of Engineering, Nagoya Institute
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Tsuchikawa Tetsuji
The Department Of Computer Science And Engineering Graduate School Of Engineering Nagoya Institute O
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SASABE Kohji
Matsushita Electric Works, Ltd.
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Sasabe Kohji
Matsushita Electric Works Ltd.
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Kato A
Univ. Tokyo Tokyo Jpn
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Fujiwara Osamu
The Authors Are With The Department Of Electrical And Computer Engineering Nagoya Institute Of Techn
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Andoh Norio
Faculty Of Engineering Nagoya Institute Of Technology
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SASABE Kohji
the Corporate Quality R&D Center of Matsushita Electric Works, Ltd.
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YOSHIDA Kazuhisa
the Corporate Quality R&D Center of Matsushita Electric Works, Ltd.
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Endoh Hironori
The Faculty of Engineering, Nagoya Institute of Technology
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Iino Koji
Faculty of Engineering, Nagoya Institute of Technology
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Nomura Michihiko
Faculty of Engineering, Nagoya Institute of Technology
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Kato Akira
Faculty of Engineering, Nagoya Institute of Technology
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Iino Koji
Faculty Of Engineering Nagoya Institute Of Technology
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Endoh Hironori
The Faculty Of Engineering Nagoya Institute Of Technology
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Nomura M
Nagoya Inst. Technology Nagoya‐shi Jpn
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Nomura Michihiko
The Faculty Of Engineering Nagoya Institute Of Technology
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Yoshida Kazuhisa
The Corporate Quality R&d Center Of Matsushita Electric Works Ltd.
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Kato Akira
Faculty Of Engineering Nagoya Institute Of Technology
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Sasabe Koji
Matsushita Electric Works, Ltd.
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Sasabe Koji
the Corporate Quality R&D Center of Matsushita Electric Works, Ltd.
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Wang Jianquig
Nagoya Institute of Technology
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Endo Hironori
The Faculty of Engineering, Nagoya Institute of Technology
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Ando Norio
Faculty of Engineering, Nagoya Institute of Technology
著作論文
- Uncertainty of the One-Gram Averaged Spatial Peak SAR in Human Head for Portable Telephones due to Average Procedures
- Localized Specific Absorption Rate in the Human Head in Metal-Framed Spectacles for 1.5 GHz hand-Held Mobile Telephones
- Analysis of Transient Electromagnetic Fields Radiated by Electrostatic Discharges
- FDTD Simulation of Shielding Effectiveness of Metal-Coated Plastics for Pulsed Electromagnetic Fields(Electromagnetic Compatibility(EMC))
- Realizing Highly Localized Exposure in Small Animals with Absorbing Material Covered Holder to Test Biological Effects of 1.5 GHz Cellular Telephones (Electromagnetic Compatibility (EMC))
- A Simple Method for Predicting Common-Mode Radiation from a Cable Attached to a Conducting Enclosure
- A Novel Setup for Small Animal Exposure to Near Fields to Test Biological Effects of Cellular Telephones
- An Analytical Approach to Model Indirect Effect Caused by Electrostatic Discharge (Special Issue on Discharge and Electromagnetic Interference)
- FDTD Analysis of Dosimetry in Human Head Model for a Helical Antenna Portable Telephone(Special Issue on Recent Progress in Electromagnetic Compatibility Technology)
- Experimental Investigation of Noise Immunity Diagnosis for Battery Drived Circuit by Bulk Current Injection Test(Special Issue on Recent Progress in in Electromagnetic Compatibility Technology)
- Head Tissue Heterogeneity Required in Compurtational Dosimetry for Portable Telephones
- Computation of Potential Attenuation Process for Charged Human Body Using Numerical Inverse Laplace Transform
- Approximation of Surface-SAR in a Realistic Head Model for Microwave Exposure Using External Magnetic Near-Field
- Usefulness of Spherical Model of Human Head in SAR Calculation for UHF Plane-Wave Exposure
- Correlation between Spatial Distributions of Surface-SAR and Magnetic Near-Field in Realistic Head Model for Microwave Exposure (Special Section of Letters Selected from the '92 Fall Conference and the '93 Spring Conference)
- Reduction of Electromagnetic Absorption in the Human Head for Portable Telephones by a Ferrite Sheet Attachment
- Computation of SAR Inside Eyeball for 1.5-GHz Microwave Exposure Using Finite-Difference Time-Domain Technique (Special Issue on Biological Effects of Electromagnetic Fields)