Conard Thierry | Imec
スポンサーリンク
概要
関連著者
-
Conard Thierry
Interuniversity Micro Electronics Center (imec)
-
Kimura Kenji
Department Of Micro Engineering Kyoto University
-
Nakamura Kunio
Department Of Micro Engineering Kyoto University
-
Nakajima Kaoru
Department Of Micro Engineering Kyoto University
-
Conard Thierry
Imec
-
Kimura Kenji
Department of Engineering Science, Kyoto University
-
NAKAJIMA Kaoru
Department of Micro Engineering, Kyoto University
-
VANDERVORST Wilfried
IMEC, Kapeldreef
-
Nakajima Kaoru
Department Of Engineering Physics And Mechanics Kyoto University
-
BERGMAIER Andreas
Institut fur Angewandte Physik und Messtechnik, Universitat de Bundeswehr Munchen
-
DOLLINGER Gunther
Institut fur Angewandte Physik und Messtechnik, Universitat de Bundeswehr Munchen
-
Vandervorst Wilfried
Imec
-
Dollinger Gunther
Institut Fur Angewandte Physik Und Messtechnik Universitat De Bundeswehr Munchen
-
Bergmaier Andreas
Institut Fur Angewandte Physik Und Messtechnik Universitat De Bundeswehr Munchen
-
Kimura Kenji
Deparment Of Engineering Science Kyoto University
著作論文
- Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Analysis of Ultra-Thin HfO_2/SiON/Si(001) : Comparison of Three Different Techniques